A professional seminar of Scientific and Technical Forum in The 2011 Shanghai International Industry Exposition ——“Characterization of advanced Inorganic Materials with different Methods” organized by Shanghai Association for Science and Technology and Shanghai Ceramic Society was held on Nov. 3rd at Shanghai Institute of Ceramics Chinese Academy of Sciences. Technical and administrative people coming from universities, research institutes and some enterprises attended this seminar. The Director of analysis and testing professional committee of SCS research fellow Mr. Zhuo Shang-jun presided over this seminar. On the seminar the report “3D-XRF Analysis for Industrial Samples and Projection Type XRF Imaging” was presented by Professor Kouichi TSUJI from University of Osaka City, Japan; Professor Xie Huaqing, Director of Urban Construction and Environmental Engineering Institute of Shanghai Second Polytechnic University presented his report “Measurement of the Thermophysical Properties of Low Dimensional Materials”; the deputy director of Inorganic Material Analysis and Testing Centre of Shanghai Institute of Ceramics Chinese Academy of Sciences research fellow Mr. XU Fang presented his report “Application of TEM in Materials Science”. The above three specialists interpreted the important significance of modern analyzing and testing methods on science and technology and development of industry by their many years’ research achievements and practical experience in the view of chemical, thermo-physical and micro-characteristic observation, respectively.